@inproceedings{d5f2ebb7d5014fb592454484b0f04420,
title = "Use of Computer Methods for Analyzing Brain Signals to Assess the Success of Adaptation of Labor Migrants to Extreme Climate Conditions",
abstract = "Labor migration is a social phenomenon that is accompanied by many positive and negative aftermaths. One of the negative aftermaths of migration is a strong increase in inclination to mental disorders among migrants. The high development rate of computer technology made it possible to carry out diagnostic measures for somatic and mental diseases in more detail. A widespread method of electrophysiological studies of the human central nervous system is registration of fluctuations in the electrical potentials of the brain from the surface of the skull-electroencephalogram (EEG). Today EEG is a reliable tool for explaining psychological phenomena and human behavior. We used this method to study the changes in the so-called default mode network of the brain (the brain in a state of calm wakefulness) in the processes of adaptation of labor migrants to extreme climate conditions. The article aims to study the relationship between functional changes in the electrophysiological activity of the default mode network with the risk of developing affective pathologies of various origins in labor migrants in the region of the Republic of Sakha (Yakutia) in the process of their adaptation to new climatic and social conditions.",
keywords = "anxiety disorder, climate adaptation, default mode network, delta rhythm, depression, disease prevention, EEG, gamma rhythm, labor migration, predisposition to depression",
author = "Nataliya Milakhina and Alexandra Karpova and Tatiana Astakhova and Alexander Savostyanov",
note = "Funding Information: Data collection and analysis was carried out with the support of the RFBR grants No. 18-415-140021 and № 18-29-13027. The work of A.N. Savostyanov and N.S. Milakhina was also supported from the budgetary project of ICG SB RAS theme No. 0259-2021-0009. Publisher Copyright: {\textcopyright} 2021 IEEE.; 22nd IEEE International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 ; Conference date: 30-06-2021 Through 04-07-2021",
year = "2021",
month = jun,
day = "30",
doi = "10.1109/EDM52169.2021.9507608",
language = "English",
series = "International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM",
publisher = "IEEE Computer Society",
pages = "577--581",
booktitle = "2021 IEEE 22nd International Conference of Young Professionals in Electron Devices and Materials, EDM 2021 - Proceedings",
address = "United States",
}