The use of 2D diffractometry data for oriented samples in the choice of a unit cell

A. S. Sukhikh; T. V. Basova; S. A. Gromilov

doi:10.1134/S0022476617050146

The use of 2D diffractometry data for oriented samples in the choice of a unit cell

A. S. Sukhikh, T. V. Basova, S. A. Gromilov

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

6 Цитирования (Scopus)

Аннотация

An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

Язык оригинала	английский
Страницы (с-по)	953-963
Число страниц	11
Журнал	Journal of Structural Chemistry
Том	58
Номер выпуска	5
DOI	https://doi.org/10.1134/S0022476617050146
Состояние	Опубликовано - 1 сен 2017

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10.1134/S0022476617050146

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keywords = "indexing, oriented samples, palladium phthalocyanines, thin films, X-ray diffractometry of polycrystals",

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The use of 2D diffractometry data for oriented samples in the choice of a unit cell. / Sukhikh, A. S.; Basova, T. V.; Gromilov, S. A.

В: Journal of Structural Chemistry, Том 58, № 5, 01.09.2017, стр. 953-963.

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

TY - JOUR

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AU - Sukhikh, A. S.

AU - Basova, T. V.

AU - Gromilov, S. A.

PY - 2017/9/1

Y1 - 2017/9/1

N2 - An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

AB - An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

KW - indexing

KW - oriented samples

KW - palladium phthalocyanines

KW - thin films

KW - X-ray diffractometry of polycrystals

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M3 - Article

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JO - Journal of Structural Chemistry

JF - Journal of Structural Chemistry

SN - 0022-4766

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