Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

N. N. Novikova; V. A. Yakovlev; S. A. Klimin; T. V. Malin; A. M. Gilinsky; K. S. Zhuravlev

doi:10.1134/S0030400X19070208

Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

N. N. Novikova, V. A. Yakovlev, S. A. Klimin, T. V. Malin, A. M. Gilinsky, K. S. Zhuravlev

Лаборатория полупроводниковых и диэлектрических материалов ФФ

Результат исследования: Научные публикации в периодических изданиях › статья

Аннотация

Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

Язык оригинала	английский
Страницы (с-по)	36-39
Число страниц	4
Журнал	Optics and Spectroscopy
Том	127
Номер выпуска	1
DOI	https://doi.org/10.1134/S0030400X19070208
Состояние	Опубликовано - 1 июл 2019

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Novikova, N. N., Yakovlev, V. A., Klimin, S. A., Malin, T. V., Gilinsky, A. M., & Zhuravlev, K. S. (2019). Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. Optics and Spectroscopy, 127(1), 36-39. https://doi.org/10.1134/S0030400X19070208

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abstract = "Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.",

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Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films. / Novikova, N. N.; Yakovlev, V. A.; Klimin, S. A.; Malin, T. V.; Gilinsky, A. M.; Zhuravlev, K. S.

В: Optics and Spectroscopy, Том 127, № 1, 01.07.2019, стр. 36-39.

Результат исследования: Научные публикации в периодических изданиях › статья

TY - JOUR

T1 - Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

AU - Novikova, N. N.

AU - Yakovlev, V. A.

AU - Klimin, S. A.

AU - Malin, T. V.

AU - Gilinsky, A. M.

AU - Zhuravlev, K. S.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

AB - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

KW - aluminum and gallium nitrides

KW - reflection and ATR spectroscopy

KW - surface polaritons

KW - VIBRATIONS

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U2 - 10.1134/S0030400X19070208

DO - 10.1134/S0030400X19070208

M3 - Article

AN - SCOPUS:85070857427

VL - 127

SP - 36

EP - 39

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 1

ER -

Доступ к документу

10.1134/S0030400X19070208

Link to publication in Scopus