Study of the temperature effect on the laser amplification process

Gleb V. Kuptsov, Vladimir A. Petrov, Victor V. Petrov, Alexey V. Laptev, Anatoliy V. Kirpichnikov, Efim V. Pestryakov

Результат исследования: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаярецензирование

Аннотация

This paper is focused on the investigation of the effect of temperature on the laser amplification process. In case of Ybdoped active media there is a significant dependency of laser and physical properties on temperature that leads to reducing of gain coefficient. Theoretical description and experimental study carried out based on Yb:YAG crystal pumped by high power laser diode. Despite the cooling of the active element, the heating significantly affects at cwpumping regime and determines the shape of gain coefficient dependency on the pump power.

Язык оригиналаанглийский
Название основной публикацииXIV International Conference on Pulsed Lasers and Laser Applications
РедакторыVictor F. Tarasenko, Anton V. Klimkin, Maxim V. Trigub
ИздательSPIE
Число страниц5
ISBN (электронное издание)9781510634114
DOI
СостояниеОпубликовано - 1 янв 2019
СобытиеXIV International Conference on Pulsed Lasers and Laser Applications, AMPL 2019 - Tomsk, Российская Федерация
Продолжительность: 15 сен 201920 сен 2019

Серия публикаций

НазваниеProceedings of SPIE - The International Society for Optical Engineering
Том11322
ISSN (печатное издание)0277-786X
ISSN (электронное издание)1996-756X

Конференция

КонференцияXIV International Conference on Pulsed Lasers and Laser Applications, AMPL 2019
СтранаРоссийская Федерация
ГородTomsk
Период15.09.201920.09.2019

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Kuptsov, G. V., Petrov, V. A., Petrov, V. V., Laptev, A. V., Kirpichnikov, A. V., & Pestryakov, E. V. (2019). Study of the temperature effect on the laser amplification process. В V. F. Tarasenko, A. V. Klimkin, & M. V. Trigub (Ред.), XIV International Conference on Pulsed Lasers and Laser Applications [113220V] (Proceedings of SPIE - The International Society for Optical Engineering; Том 11322). SPIE. https://doi.org/10.1117/12.2550839