Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)

A. I. Chichinin; M. Poretskiy; C. Maul; K. H. Gericke

doi:10.3103/S1068335618100044

Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H⁺, Cl⁺, HCl⁺)

A. I. Chichinin, M. Poretskiy, C. Maul, K. H. Gericke

Кафедра квантовой электроники ФФ

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

1 Цитирования (Scopus)

Аннотация

A trap for positive ions (H⁺, Cl⁺, HCl⁺) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl⁻, H⁻) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

Язык оригинала	английский
Страницы (с-по)	303-307
Число страниц	5
Журнал	Bulletin of the Lebedev Physics Institute
Том	45
Номер выпуска	10
DOI	https://doi.org/10.3103/S1068335618100044
Состояние	Опубликовано - 1 окт 2018

Доступ к документу

10.3103/S1068335618100044

Link to publication in Scopus

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Цитировать

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abstract = "A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl−, H−) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.",

keywords = "Cl, H, HCl, ion collisions with surface, resonance-enhanced multiphoton ionization, time-of-flight mass-spectrometry",

author = "Chichinin, {A. I.} and M. Poretskiy and C. Maul and Gericke, {K. H.}",

year = "2018",

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Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H⁺, Cl⁺, HCl⁺). / Chichinin, A. I.; Poretskiy, M.; Maul, C.; Gericke, K. H.

В: Bulletin of the Lebedev Physics Institute, Том 45, № 10, 01.10.2018, стр. 303-307.

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

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AU - Poretskiy, M.

AU - Maul, C.

AU - Gericke, K. H.

PY - 2018/10/1

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N2 - A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl−, H−) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

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KW - Cl

KW - H

KW - HCl

KW - ion collisions with surface

KW - resonance-enhanced multiphoton ionization

KW - time-of-flight mass-spectrometry

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