Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films

Svetlana V. Postolova, Alexey Yu Mironov, Mikhail R. Baklanov, Valerii M. Vinokur, Tatyana I. Baturina

Результат исследования: Научные публикации в периодических изданияхстатья

6 Цитирования (Scopus)

Аннотация

A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.

Язык оригиналаанглийский
Номер статьи1718
Страницы (с-по)1718
Число страниц7
ЖурналScientific Reports
Том7
Номер выпуска1
DOI
СостояниеОпубликовано - 11 мая 2017

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  • Цитировать

    Postolova, S. V., Mironov, A. Y., Baklanov, M. R., Vinokur, V. M., & Baturina, T. I. (2017). Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films. Scientific Reports, 7(1), 1718. [1718]. https://doi.org/10.1038/s41598-017-01753-w