Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

A. K. Nikitin; O. V. Khitrov; V. V. Gerasimov

doi:10.1088/1742-6596/1636/1/012037

Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

A. K. Nikitin, O. V. Khitrov, V. V. Gerasimov

Лаборатория прикладной электродинамики ФФ

Результат исследования: Научные публикации в периодических изданиях › статья по материалам конференции › рецензирование

Аннотация

The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

Язык оригинала	английский
Номер статьи	012037
Журнал	Journal of Physics: Conference Series
Том	1636
Номер выпуска	1
DOI	https://doi.org/10.1088/1742-6596/1636/1/012037
Состояние	Опубликовано - 9 окт. 2020
Событие	22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 - Moscow, Российская Федерация Продолжительность: 3 мар. 2020 → 5 мар. 2020

Доступ к документу

10.1088/1742-6596/1636/1/012037

Другие файлы и ссылки

Link to publication in Scopus

Fingerprint

Подробные сведения о темах исследования «Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать

@article{b51f9c6f61e64b6382e2ea4f24d41361,

title = "Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range",

abstract = "The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.",

author = "Nikitin, {A. K.} and Khitrov, {O. V.} and Gerasimov, {V. V.}",

year = "2020",

month = oct,

day = "9",

doi = "10.1088/1742-6596/1636/1/012037",

language = "English",

volume = "1636",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 ; Conference date: 03-03-2020 Through 05-03-2020",

}

Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range. / Nikitin, A. K.; Khitrov, O. V.; Gerasimov, V. V.

В: Journal of Physics: Conference Series, Том 1636, № 1, 012037, 09.10.2020.

Результат исследования: Научные публикации в периодических изданиях › статья по материалам конференции › рецензирование

TY - JOUR

T1 - Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

AU - Nikitin, A. K.

AU - Khitrov, O. V.

AU - Gerasimov, V. V.

PY - 2020/10/9

Y1 - 2020/10/9

N2 - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

AB - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

UR - http://www.scopus.com/inward/record.url?scp=85092616908&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1636/1/012037

DO - 10.1088/1742-6596/1636/1/012037

M3 - Conference article

AN - SCOPUS:85092616908

VL - 1636

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012037

T2 - 22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020

Y2 - 3 March 2020 through 5 March 2020

ER -