Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

A. K. Nikitin, O. V. Khitrov, V. V. Gerasimov

Результат исследования: Научные публикации в периодических изданияхстатья по материалам конференциирецензирование

Аннотация

The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

Язык оригиналаанглийский
Номер статьи012037
ЖурналJournal of Physics: Conference Series
Том1636
Номер выпуска1
DOI
СостояниеОпубликовано - 9 окт 2020
Событие22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 - Moscow, Российская Федерация
Продолжительность: 3 мар 20205 мар 2020

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