Plasmon-Enhanced Near-Field Optical Spectroscopy of Multicomponent Semiconductor Nanostructures

K. V. Anikin, A. G. Milekhin, M. Rahaman, T. A. Duda, I. A. Milekhin, E. E. Rodyakina, R. B. Vasiliev, V. M. Dzhagan, D. R.T. Zahn, A. V. Latyshev

Результат исследования: Научные публикации в периодических изданияхстатья

Аннотация

Multicomponent semiconductor nanostructures were studied by local spectral analysis based on surface-enhanced Raman scattering by semiconductor nanostructures located on the surface of an array of Au nanoclusters near the metallized tip of an atomic force microscope. In the gap between the metal nanoclusters and the tip, where a semiconductor nanostructure is located, there is a strong increase in the local electric field (hot spot), resulting in a dramatic enhancement of the Raman scattering signal. An unprecedented enhancement of the Raman scattering signal by two-dimensional (over 108 for MoS2) and zero-dimensional (106 for CdSe nanocrystals) semiconductor nanostructures was achieved. The use of the method for mapping the Raman scattering response of a multicomponent system of MoS2 and CdSe made it possible to identify components with a spatial resolution far exceeding the diffraction limit.

Язык оригиналаанглийский
Страницы (с-по)488-494
Число страниц7
ЖурналOptoelectronics, Instrumentation and Data Processing
Том55
Номер выпуска5
DOI
СостояниеОпубликовано - 1 сен 2019

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