@article{eeecdbe4eb9840699373d5032da7b6a2,
title = "Oxygen vacancies in zirconium oxide as the blue luminescence centres and traps responsible for charge transport: Part II—Films",
abstract = "The origin of charge carrier traps in ZrO2 films was studied using charge transport measurements, EPR spectroscopy and quantum-chemical calculations. After the X-ray irradiation of the ZrO2 films, the EPR spectra from an interstitial oxygen and a negatively charged oxygen vacancy are observed. The trap thermal and optical activation energies 1.25 eV and 2.5 eV are estimated from the charge transport measurements. Within experiments on the extraction of minority carriers from silicon substrates, it was demonstrated that both electrons and holes can be trapped on oxygen vacancies in ZrO2. Hence, oxygen vacancies are supposed to operate as traps responsible for the charge transport in ZrO2 films.",
keywords = "Charge transport, Defects, EPR, Oxygen vacancy, Zirconium oxide",
author = "Islamov, {Damir R.} and Gritsenko, {Vladimir A.} and Perevalov, {Timofey V.} and Aliev, {Vladimir Sh} and Nadolinny, {Vladimir A.} and Albert Chin",
note = "Funding Information: This work was partly supported by the Russian Science Foundation under grant No. 16-19-00002 (quantum chemical simulations, transport measurements and simulations), and partly supported by the ISP SB RAS state research program, project No. 0306-2019-0005 (EPR spectroscopy). The simulations were performed using computing clusters of the Rzhanov Institute of Semiconductor Physics SB RAS and Novosibirsk State University. Publisher Copyright: {\textcopyright} 2020 Acta Materialia Inc. Copyright: Copyright 2020 Elsevier B.V., All rights reserved.",
year = "2021",
month = mar,
doi = "10.1016/j.mtla.2020.100980",
language = "English",
volume = "15",
journal = "Materialia",
issn = "2589-1529",
}