@article{47b87e81fe8c465188e9189bc56623a5,
title = "Nanowired structure, optical properties and conduction band offset of RF magnetron-deposited n-Si/In2O3:Er films",
abstract = "RF magnetron-deposited Si\In2O3:Er films have the structure of the single-crystalline bixbyite bcc In2O3 nanowires bunched into the columns extended across the films. The obtained films have a typical In2O3 optical band gap of 3.55 eV and demonstrate the 1.54 μm Er3+ room temperature photoluminescence. The current across the film flows inside the columns through the nanowires. The current through the MOS-structure with the intermediate low barrier In2O3:Er dielectric was investigated by the thermionic emission approach, with respect to the partial voltage drop in silicon. Schottky plots ln(I/T 2) versus 1/kT of forward currents at small biases and backward currents in saturation give the electron forward n-Si\In2O3:Er barrier equal to 0.14 eV and the backward In\In2O3:Er barrier equal to 0.21 eV.",
keywords = "Band offset, InO:Er, Nanowires, Photoluminescence, Silicon, Thermionic emission, Thin films, thermionic emission, band offset, photoluminescence, EXCITATION, PHOTOLUMINESCENCE, ER3+, In2O3, ELECTRICAL-PROPERTIES, SILICON, Er, ERBIUM, ELECTROLUMINESCENCE, thin films, nanowires, OXIDE THIN-FILMS, IN2O3, >",
author = "Feklistov, {K. V.} and Lemzyakov, {A. G.} and Prosvirin, {I. P.} and Gismatulin, {A. A.} and Shklyaev, {A. A.} and Zhivodkov, {Y. A.} and G. Krivyakin and Komonov, {A. I.} and Kozhukhov, {A. S.} and Spesivsev, {E. V.} and Gulyaev, {D. V.} and Abramkin, {D. S.} and Pugachev, {A. M.} and Esaev, {D. G.} and Sidorov, {G. Y.}",
note = "Funding Information: The work was supported by the Ministry of Science and Higher Education of the Russian Federation (project No. 0306-2019-0005) for electrical measurements and (grant No. 075-15-2020-797 (13.1902.21.0024)) for electron microscopy studies, and by the State Assignment No. AAAA-A17-117052410033-9 for optical measurements. Publisher Copyright: {\textcopyright} 2020 The Author(s). Published by IOP Publishing Ltd Copyright: Copyright 2020 Elsevier B.V., All rights reserved.",
year = "2020",
month = dec,
doi = "10.1088/2053-1591/abd06b",
language = "English",
volume = "7",
journal = "Materials Research Express",
issn = "2053-1591",
publisher = "IOP Publishing Ltd.",
number = "12",
}