Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces

V. V. Atuchin, V. L. Bekenev, Yu A. Borovlev, E. N. Galashov, O. Y. Khyzhun, A. S. Kozhukhov, L. D. Pokrovsky, V. N. Zhdankov

Результат исследования: Научные публикации в периодических изданияхстатьярецензирование

1 Цитирования (Scopus)

Аннотация

The large optical-quality MWO4 (M = Zn, Cd) crystals of mass up to 14 (ZnWO4) and 20 (CdWO4) kg were grown by Low Thermal Gradient Czochralski Technique (LTG Cz). Crystallographic properties of MWO 4(010) cleaved surface were evaluated by AFM and RHEED, and electronic structure of the surface was studied using XPS. A system of Kikuchi lines has been observed for cleaved MWO4(010) by RHEED confirming high crystallographic quality of the surface. The XPS valence-band and core-level spectra of MWO4(010) have been measured. The XPS measurements reveal that W and M atoms are in the formal valences 6+ and 2+, respectively, on cleaved MWO4(010) surface.

Язык оригиналаанглийский
Страницы (с-по)86-90
Число страниц5
ЖурналJournal of Optoelectronics and Advanced Materials
Том19
Номер выпуска1-2
СостояниеОпубликовано - 1 янв. 2017

Fingerprint

Подробные сведения о темах исследования «Low thermal gradient Czochralski growth of large MWO4 (M = Zn, Cd) crystals, and microstructural and electronic properties of the (010) cleaved surfaces». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать