As an alternative approach for measuring the weak effects associated with the artificial preparation of rare events in quantum metrology, we propose the study of the interference pattern generated by acts of pre- A nd postselection of a quantum system. An example of two Mach-Zehnder interferometers connected by a cross-Kerr nonlinearity is considered. Postselection of photon states at the output of one of the interferometers and the application of a controlled phase shift in one of its arms induces interference phenomena in the photodetection statistics at the output of the second interferometer. The nonlinearity parameter determines the shift and width of the structures in the interference pattern. The main features of this pattern are studied depending on the magnitude of the Kerr nonlinearity and the number of photons at the input of the interferometers.