A method has been developed that allows X-ray structural analysis of polycrystals using a broad spectral band of synchrotron radiation in the range of 20-30 keV. This makes it possible to increase the number of photons in the primary beam by 2-3 orders of magnitude and, accordingly, reduce the exposure time of obtaining X-ray diffraction patterns to nanoseconds. The method is applied to reconstruct the X-ray diffraction pattern of silver behenate from the experimental X-ray diffraction curve obtained on polychromatic radiation of the VEPP-3 storage ring, which is an overlay of a thousand X-ray patterns at a thousand fixed wavelengths. It's reduced the exposure time of one X-ray diffraction patterns of a silver behenate polycrystal to 25 ns. The use of polychromatic synchrotron radiation (SR) opens up new possibilities for studying fast processes not only at XFELs but additionally at storage rings like the VEPP-3/VEPP-4 type and will provide information on the kinetics of phase formation of explosion products directly after the detonation waves.