Scanning devices based on multirow focal plane arrays providing increased resolution impose much more stringent requirements on alignment than single-row arrays. This paper presents a new method for measuring and estimating the scanning speed and the angle of orientation of a multirow focal plane array relative to the scanning direction — the parameters that determine the quality of the discrete image formed. The method is based on an analysis of the image of a simple test object — an optical slit. An algorithm for estimating these parameters is proposed which provides high-accuracy estimates under fairly weak requirements for the image quality of the test object. The estimation accuracy was calculated analytically and confirmed by simulation modeling.
|Журнал||Optoelectronics, Instrumentation and Data Processing|
|Состояние||Опубликовано - 1 ноя 2017|