Dynamics of Growth of the Native Oxide of Cd xHg1−xTe

G. Yu Sidorov, V. A. Shvets, Yu G. Sidorov, V. S. Varavin

Результат исследования: Научные публикации в периодических изданияхстатьярецензирование

2 Цитирования (Scopus)


The growth of the native oxide of the CdxHg1−xTe (MCT) compound is studied by methods of laser and spectral ellipsometry. It is found that a non-absorbing oxide film is formed from the very beginning in the case of MCT oxidation with hydrogen peroxide vapors, whereas oxidation with atmospheric oxygen leads to the formation of absorbing layers on the surface at the first stages of the process. When the oxide film thickness reaches 1–2 nm, the oxidation rate drastically decreases. If MCT samples that were stored for a long time (for years) in air at room temperature are heated at T = 200 °C, the optical thickness of the oxide film decreases.

Язык оригиналаанглийский
Страницы (с-по)617-624
Число страниц8
ЖурналOptoelectronics, Instrumentation and Data Processing
Номер выпуска6
СостояниеОпубликовано - 1 ноя 2017


Подробные сведения о темах исследования «Dynamics of Growth of the Native Oxide of Cd xHg1−xTe». Вместе они формируют уникальный семантический отпечаток (fingerprint).