Аннотация
A procedure of the X-ray diffraction study of thin layers using a single crystal X-ray diffractometer equipped with a microfocus tube is described. It is demonstrated that α-cobalt phthalocyanine layers deposited by thermal vacuum evaporation onto polished surfaces of substrates (glass, quartz) have a perfectly oriented polycrystalline structure. The (00l) planes of all crystallites are oriented along the surface of the substrate. The structural organization of layers is analyzed.
Язык оригинала | английский |
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Страницы (с-по) | 618-621 |
Число страниц | 4 |
Журнал | Journal of Structural Chemistry |
Том | 57 |
Номер выпуска | 3 |
DOI | |
Состояние | Опубликовано - 1 мая 2016 |