Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam

Bongho Kim; Sunghan Bae; Hyunsuk Choi; Seonho Choi; Naritoshi Kawamura; Ryo Kitamura; Ho San Ko; Yasuhiro Kondo; Tsutomu Mibe; Masashi Otani; Georgiy P. Razuvaev; Eunil Won

doi:10.1016/j.nima.2018.05.014

Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam

Bongho Kim, Sunghan Bae, Hyunsuk Choi, Seonho Choi, Naritoshi Kawamura, Ryo Kitamura, Ho San Ko, Yasuhiro Kondo, Tsutomu Mibe, Masashi Otani, Georgiy P. Razuvaev, Eunil Won

Кафедра физики ФФ и СУНЦ НГУ

Результат исследования: Научные публикации в периодических изданиях › статья

4 Цитирования (Scopus)

Аннотация

A beam profile monitor (BPM) based on a microchannel plate has been developed for muon beams with low transverse momentum for the measurement of the muon anomalous magnetic moment and electric dipole moment at high precision, with capability of diagnosing muon beams of kinetic energy range from a few keV to 4 MeV. The performance of the BPM has been evaluated using a surface muon beam at J-PARC and additionally with an ultraviolet (UV) light source. It has been confirmed that the BPM has a dynamic range from a few to 10⁴ muons per bunch without saturation. The spatial resolution of the BPM has been estimated to be less than 0.30 mm. The positron background from muon decays is an obstacle in muon beam profile monitoring and a partial discrimination of the positrons has been achieved under discrete particle conditions.

Язык оригинала	английский
Страницы (с-по)	22-27
Число страниц	6
Журнал	Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Том	899
DOI	https://doi.org/10.1016/j.nima.2018.05.014
Состояние	Опубликовано - 11 авг 2018

Доступ к документу

10.1016/j.nima.2018.05.014

Link to publication in Scopus

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Цитировать

Kim, B., Bae, S., Choi, H., Choi, S., Kawamura, N., Kitamura, R., Ko, H. S., Kondo, Y., Mibe, T., Otani, M., Razuvaev, G. P., & Won, E. (2018). Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 899, 22-27. https://doi.org/10.1016/j.nima.2018.05.014

Kim, Bongho ; Bae, Sunghan ; Choi, Hyunsuk ; Choi, Seonho ; Kawamura, Naritoshi ; Kitamura, Ryo ; Ko, Ho San ; Kondo, Yasuhiro ; Mibe, Tsutomu ; Otani, Masashi ; Razuvaev, Georgiy P. ; Won, Eunil. / Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam. В: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2018 ; Том 899. стр. 22-27.

@article{689cdc44f7e741fd9a38f5109b3a4457,

title = "Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam",

abstract = "A beam profile monitor (BPM) based on a microchannel plate has been developed for muon beams with low transverse momentum for the measurement of the muon anomalous magnetic moment and electric dipole moment at high precision, with capability of diagnosing muon beams of kinetic energy range from a few keV to 4 MeV. The performance of the BPM has been evaluated using a surface muon beam at J-PARC and additionally with an ultraviolet (UV) light source. It has been confirmed that the BPM has a dynamic range from a few to 104 muons per bunch without saturation. The spatial resolution of the BPM has been estimated to be less than 0.30 mm. The positron background from muon decays is an obstacle in muon beam profile monitoring and a partial discrimination of the positrons has been achieved under discrete particle conditions.",

keywords = "Beam diagnostics, Beam profile, Low emittance muon beam, Microchannel plate",

author = "Bongho Kim and Sunghan Bae and Hyunsuk Choi and Seonho Choi and Naritoshi Kawamura and Ryo Kitamura and Ko, {Ho San} and Yasuhiro Kondo and Tsutomu Mibe and Masashi Otani and Razuvaev, {Georgiy P.} and Eunil Won",

year = "2018",

month = aug,

day = "11",

doi = "10.1016/j.nima.2018.05.014",

language = "English",

volume = "899",

pages = "22--27",

journal = "Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",

issn = "0168-9002",

publisher = "Elsevier Science B.V.",

}

Kim, B, Bae, S, Choi, H, Choi, S, Kawamura, N, Kitamura, R, Ko, HS, Kondo, Y, Mibe, T, Otani, M, Razuvaev, GP & Won, E 2018, 'Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, том. 899, стр. 22-27. https://doi.org/10.1016/j.nima.2018.05.014

Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam. / Kim, Bongho; Bae, Sunghan; Choi, Hyunsuk; Choi, Seonho; Kawamura, Naritoshi; Kitamura, Ryo; Ko, Ho San; Kondo, Yasuhiro; Mibe, Tsutomu; Otani, Masashi; Razuvaev, Georgiy P.; Won, Eunil.

В: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Том 899, 11.08.2018, стр. 22-27.

Результат исследования: Научные публикации в периодических изданиях › статья

TY - JOUR

T1 - Development of a microchannel plate based beam profile monitor for a re-accelerated muon beam

AU - Kim, Bongho

AU - Bae, Sunghan

AU - Choi, Hyunsuk

AU - Choi, Seonho

AU - Kawamura, Naritoshi

AU - Kitamura, Ryo

AU - Ko, Ho San

AU - Kondo, Yasuhiro

AU - Mibe, Tsutomu

AU - Otani, Masashi

AU - Razuvaev, Georgiy P.

AU - Won, Eunil

PY - 2018/8/11

Y1 - 2018/8/11

N2 - A beam profile monitor (BPM) based on a microchannel plate has been developed for muon beams with low transverse momentum for the measurement of the muon anomalous magnetic moment and electric dipole moment at high precision, with capability of diagnosing muon beams of kinetic energy range from a few keV to 4 MeV. The performance of the BPM has been evaluated using a surface muon beam at J-PARC and additionally with an ultraviolet (UV) light source. It has been confirmed that the BPM has a dynamic range from a few to 104 muons per bunch without saturation. The spatial resolution of the BPM has been estimated to be less than 0.30 mm. The positron background from muon decays is an obstacle in muon beam profile monitoring and a partial discrimination of the positrons has been achieved under discrete particle conditions.

AB - A beam profile monitor (BPM) based on a microchannel plate has been developed for muon beams with low transverse momentum for the measurement of the muon anomalous magnetic moment and electric dipole moment at high precision, with capability of diagnosing muon beams of kinetic energy range from a few keV to 4 MeV. The performance of the BPM has been evaluated using a surface muon beam at J-PARC and additionally with an ultraviolet (UV) light source. It has been confirmed that the BPM has a dynamic range from a few to 104 muons per bunch without saturation. The spatial resolution of the BPM has been estimated to be less than 0.30 mm. The positron background from muon decays is an obstacle in muon beam profile monitoring and a partial discrimination of the positrons has been achieved under discrete particle conditions.

KW - Beam diagnostics

KW - Beam profile

KW - Low emittance muon beam

KW - Microchannel plate

UR - http://www.scopus.com/inward/record.url?scp=85048760365&partnerID=8YFLogxK

U2 - 10.1016/j.nima.2018.05.014

DO - 10.1016/j.nima.2018.05.014

M3 - Article

AN - SCOPUS:85048760365

VL - 899

SP - 22

EP - 27

JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

ER -