Development, calibration and application of new-generation dissector with picosecond temporal resolution

O. I. Meshkov, O. V. Anchugov, V. L. Dorokhov, G. Ya Kurkin, A. N. Petrozhitsky, D. V. Shvedov, E. I. Zinin, P. B. Gornostaev, M. Ya Schelev, E. V. Shashkov, A. V. Smirnov, A. I. Zarovskii

Результат исследования: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаярецензирование

Аннотация

A dissector is an electron-optical device designed for measurement of periodic light pulses of subnanosecond and picosecond duration. LI-602 dissector developed at BINP SB RAS is widely used for routine measurements of a longitudinal profile of electron and positron beams at BINP electron-positron colliders and other similar installations [1-3]. LI-602 dissector is a part of many optical diagnostic systems and provides temporal resolution of about 20 ps. Recently a new generation of picosecond dissectors were created on the basis of the PIF-01/S1 picosecond streak-image tube designed and manufactured at the GPI Photoelectronics Department [4, 8-10]. The results of the measurements of instrument function of the new dissector based on PIF-01/S1, which were carried out in the static mode [5], showed that temporal resolution of the dissector can be better than 3-4 ps (FWHM). The results of temporal resolution calibration of the new-generation picosecond dissector carried out at the specialized set-up based on a femtosecond Ti:sapphire laser and recent results of longitudinal beam profile measurements at BINP damping ring are given in this work.

Язык оригиналаанглийский
Название основной публикацииProceedings of the 5th International Beam Instrumentation Conference, IBIC 2016
ИздательJoint Accelerator Conferences Website (JACoW)
Страницы205-208
Число страниц4
ISBN (электронное издание)9783954501779
СостояниеОпубликовано - 1 янв. 2016
Событие5th International Beam Instrumentation Conference, IBIC 2016 - Barcelona, Испания
Продолжительность: 11 сент. 201615 сент. 2016

Серия публикаций

НазваниеProceedings of the 5th International Beam Instrumentation Conference, IBIC 2016

Конференция

Конференция5th International Beam Instrumentation Conference, IBIC 2016
Страна/TерриторияИспания
ГородBarcelona
Период11.09.201615.09.2016

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