Determination of void fraction of two-phase flow in slit microchannel

Yuriy Dementyev, Fedor Ronshin

Результат исследования: Публикации в книгах, отчётах, сборниках, трудах конференцийстатья в сборнике материалов конференциинаучнаярецензирование

Аннотация

With the development of miniaturization of devices in various fields (medicine, chemistry, microelectronics), a central problem is the study of hydrodynamic processes in microsystems. One of the main parameters characterizing a two-phase flow is void fraction. In the present work, the void fraction in the slit microchannel with the height of 56 μm and the width of 10 mm was determined using shlieren technique and special algorithm developed in Matlab®. Furthermore, the dependence between time averaged void fraction and homogeneous void fraction was created. The comparison between experimental data and existed void fraction correlations was performed. It was shown that correlations of Kawahara[1] and Xiong and Chung[2] developed for circle and rectangular microchannels qualitatively describe the behavior of void fraction in slit microchannel too.

Язык оригиналаанглийский
Название основной публикацииThermophysical Basis of Energy Technologies, TBET 2019
РедакторыGeniy Kuznetsov, Dmitry Feoktistov, Evgeniya Orlova
ИздательAmerican Institute of Physics Inc.
ISBN (электронное издание)9780735419636
DOI
СостояниеОпубликовано - 13 мар 2020
Событие2019 Thermophysical Basis of Energy Technologies - Tomsk, Российская Федерация
Продолжительность: 9 окт 201911 окт 2019

Серия публикаций

НазваниеAIP Conference Proceedings
Том2212
ISSN (печатное издание)0094-243X
ISSN (электронное издание)1551-7616

Конференция

Конференция2019 Thermophysical Basis of Energy Technologies
СтранаРоссийская Федерация
ГородTomsk
Период09.10.201911.10.2019

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Dementyev, Y., & Ronshin, F. (2020). Determination of void fraction of two-phase flow in slit microchannel. В G. Kuznetsov, D. Feoktistov, & E. Orlova (Ред.), Thermophysical Basis of Energy Technologies, TBET 2019 [020015] (AIP Conference Proceedings; Том 2212). American Institute of Physics Inc.. https://doi.org/10.1063/5.0001279