Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov, G. V. Kuptsov, A. I. Nozdrina, V. A. Petrov, A. V. Laptev, A. V. Kirpichnikov, E. V. Pestryakov

Результат исследования: Научные публикации в периодических изданияхстатья

3 Цитирования (Scopus)

Аннотация

A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

Язык оригиналаанглийский
Страницы (с-по)358-361
Число страниц4
ЖурналQuantum Electronics
Том49
Номер выпуска4
DOI
СостояниеОпубликовано - 1 янв 2019

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