Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov; G. V. Kuptsov; A. I. Nozdrina; V. A. Petrov; A. V. Laptev; A. V. Kirpichnikov; E. V. Pestryakov

doi:10.1070/QEL16972

Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov, G. V. Kuptsov, A. I. Nozdrina, V. A. Petrov, A. V. Laptev, A. V. Kirpichnikov, E. V. Pestryakov

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

9 Цитирования (Scopus)

Аннотация

A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm^-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

Язык оригинала	английский
Страницы (с-по)	358-361
Число страниц	4
Журнал	Quantum Electronics
Том	49
Номер выпуска	4
DOI	https://doi.org/10.1070/QEL16972
Состояние	Опубликовано - 1 янв 2019

Доступ к документу

10.1070/QEL16972

Link to publication in Scopus

Fingerprint

Подробные сведения о темах исследования «Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать

@article{24d5ba8a5bf047c0bc58c2cdb3cb1401,

title = "Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier",

abstract = "A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.",

keywords = "cryogenic temperatures, diode pumping, high pulse repetition rate, laser amplifier, laser thermometry, AVERAGE-POWER, LASER CRYSTALS",

author = "Petrov, {V. V.} and Kuptsov, {G. V.} and Nozdrina, {A. I.} and Petrov, {V. A.} and Laptev, {A. V.} and Kirpichnikov, {A. V.} and Pestryakov, {E. V.}",

year = "2019",

month = jan,

day = "1",

doi = "10.1070/QEL16972",

language = "English",

volume = "49",

pages = "358--361",

journal = "Quantum Electronics",

issn = "1063-7818",

publisher = "Turpion Ltd.",

number = "4",

}

Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. / Petrov, V. V.; Kuptsov, G. V.; Nozdrina, A. I.; Petrov, V. A.; Laptev, A. V.; Kirpichnikov, A. V.; Pestryakov, E. V.

В: Quantum Electronics, Том 49, № 4, 01.01.2019, стр. 358-361.

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

TY - JOUR

T1 - Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

AU - Petrov, V. V.

AU - Kuptsov, G. V.

AU - Nozdrina, A. I.

AU - Petrov, V. A.

AU - Laptev, A. V.

AU - Kirpichnikov, A. V.

AU - Pestryakov, E. V.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

AB - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

KW - cryogenic temperatures

KW - diode pumping

KW - high pulse repetition rate

KW - laser amplifier

KW - laser thermometry

KW - AVERAGE-POWER

KW - LASER CRYSTALS

UR - http://www.scopus.com/inward/record.url?scp=85066282901&partnerID=8YFLogxK

U2 - 10.1070/QEL16972

DO - 10.1070/QEL16972

M3 - Article

AN - SCOPUS:85066282901

VL - 49

SP - 358

EP - 361

JO - Quantum Electronics

JF - Quantum Electronics

SN - 1063-7818

IS - 4

ER -