Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov; G. V. Kuptsov; A. I. Nozdrina; V. A. Petrov; A. V. Laptev; A. V. Kirpichnikov; E. V. Pestryakov

doi:10.1070/QEL16972

Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov, G. V. Kuptsov, A. I. Nozdrina, V. A. Petrov, A. V. Laptev, A. V. Kirpichnikov, E. V. Pestryakov

Результат исследования: Научные публикации в периодических изданиях › статья

3 Цитирования (Scopus)

Аннотация

A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm^-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

Язык оригинала	английский
Страницы (с-по)	358-361
Число страниц	4
Журнал	Quantum Electronics
Том	49
Номер выпуска	4
DOI	https://doi.org/10.1070/QEL16972
Состояние	Опубликовано - 1 янв 2019

Доступ к документу

10.1070/QEL16972

Link to publication in Scopus

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Цитировать

Petrov, V. V., Kuptsov, G. V., Nozdrina, A. I., Petrov, V. A., Laptev, A. V., Kirpichnikov, A. V., & Pestryakov, E. V. (2019). Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. Quantum Electronics, 49(4), 358-361. https://doi.org/10.1070/QEL16972

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abstract = "A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.",

keywords = "cryogenic temperatures, diode pumping, high pulse repetition rate, laser amplifier, laser thermometry, AVERAGE-POWER, LASER CRYSTALS",

author = "Petrov, {V. V.} and Kuptsov, {G. V.} and Nozdrina, {A. I.} and Petrov, {V. A.} and Laptev, {A. V.} and Kirpichnikov, {A. V.} and Pestryakov, {E. V.}",

year = "2019",

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doi = "10.1070/QEL16972",

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Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier. / Petrov, V. V.; Kuptsov, G. V.; Nozdrina, A. I.; Petrov, V. A.; Laptev, A. V.; Kirpichnikov, A. V.; Pestryakov, E. V.

В: Quantum Electronics, Том 49, № 4, 01.01.2019, стр. 358-361.

Результат исследования: Научные публикации в периодических изданиях › статья

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AU - Nozdrina, A. I.

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AU - Laptev, A. V.

AU - Kirpichnikov, A. V.

AU - Pestryakov, E. V.

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KW - cryogenic temperatures

KW - diode pumping

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KW - laser amplifier

KW - laser thermometry

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