Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

Результат исследования: Научные публикации в периодических изданияхстатьярецензирование

1 Цитирования (Scopus)

Аннотация

In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominant in the bulk, while the diffusion one reaches significant values near contacts. A comparison with other theoretical models and experiments shows a good agreement. The model can be extended to two- and three-dimensional systems. The developed model, formulated in partial differential equations, can be numerically implemented in the finite element method code.

Язык оригиналаанглийский
Номер статьи15759
Число страниц10
ЖурналScientific Reports
Том10
Номер выпуска1
DOI
СостояниеОпубликовано - 1 дек 2020

Fingerprint Подробные сведения о темах исследования «Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать