A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics

G. M. Borisov, V. G. Gol’dort, A. A. Kovalyov, D. V. Ledovskikh, N. N. Rubtsova

Результат исследования: Научные публикации в периодических изданияхстатья

1 Цитирования (Scopus)

Аннотация

A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.

Язык оригиналаанглийский
Страницы (с-по)94-98
Число страниц5
ЖурналInstruments and Experimental Techniques
Том61
Номер выпуска1
DOI
СостояниеОпубликовано - 1 янв 2018

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