A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics

G. M. Borisov; V. G. Gol’dort; A. A. Kovalyov; D. V. Ledovskikh; N. N. Rubtsova

doi:10.1134/S0020441218010025

A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics

G. M. Borisov, V. G. Gol’dort, A. A. Kovalyov, D. V. Ledovskikh, N. N. Rubtsova

Кафедра общей физики ФФ

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

3 Цитирования (Scopus)

Аннотация

A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10^–6was reached.

Язык оригинала	английский
Страницы (с-по)	94-98
Число страниц	5
Журнал	Instruments and Experimental Techniques
Том	61
Номер выпуска	1
DOI	https://doi.org/10.1134/S0020441218010025
Состояние	Опубликовано - 1 янв 2018

Доступ к документу

10.1134/S0020441218010025

Link to publication in Scopus

Fingerprint Подробные сведения о темах исследования «A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics». Вместе они формируют уникальный семантический отпечаток (fingerprint).

Цитировать

@article{7916a89a23304cc1bfcd7170b4b846e3,

title = "A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics",

abstract = "A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.",

keywords = "LASER",

author = "Borisov, {G. M.} and Gol{\textquoteright}dort, {V. G.} and Kovalyov, {A. A.} and Ledovskikh, {D. V.} and Rubtsova, {N. N.}",

year = "2018",

month = jan,

day = "1",

doi = "10.1134/S0020441218010025",

language = "English",

volume = "61",

pages = "94--98",

journal = "Instruments and Experimental Techniques",

issn = "0020-4412",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "1",

}

A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics. / Borisov, G. M.; Gol’dort, V. G.; Kovalyov, A. A.; Ledovskikh, D. V.; Rubtsova, N. N.

В: Instruments and Experimental Techniques, Том 61, № 1, 01.01.2018, стр. 94-98.

Результат исследования: Научные публикации в периодических изданиях › статья › рецензирование

TY - JOUR

T1 - A Technique for Detecting Subpicosecond Reflection or Transmission Kinetics

AU - Borisov, G. M.

AU - Gol’dort, V. G.

AU - Kovalyov, A. A.

AU - Ledovskikh, D. V.

AU - Rubtsova, N. N.

PY - 2018/1/1

Y1 - 2018/1/1

N2 - A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.

AB - A double-modulation technique was developed and tested experimentally for the detection of the kinetics of reflection of subpicosecond pulses of probe near-IR radiation from a sample (or transmission through it) after the action of exciting radiation pulses. A probe signal is detected at a frequency that is equal to the sum of stabilized unequal frequencies of interrupting exciting and probe radiations, thus permitting the elimination of the contribution of scattered exciting radiation from the valid signal. When detecting the semiconductor- sample reflectance kinetics with a time resolution of 0.13 ps, the reflection sensitivity ΔR/R = 5 × 10–6was reached.

KW - LASER

UR - http://www.scopus.com/inward/record.url?scp=85042909792&partnerID=8YFLogxK

U2 - 10.1134/S0020441218010025

DO - 10.1134/S0020441218010025

M3 - Article

AN - SCOPUS:85042909792

VL - 61

SP - 94

EP - 98

JO - Instruments and Experimental Techniques

JF - Instruments and Experimental Techniques

SN - 0020-4412

IS - 1

ER -