A Study of the Crystal Structure of Co40Fe40B20 Epitaxial Films on a Bi2Te3 Topological Insulator

A. K. Kaveev, S. M. Suturin, N. S. Sokolov, K. A. Kokh, O. E. Tereshchenko

Результат исследования: Научные публикации в периодических изданияхстатьярецензирование

4 Цитирования (Scopus)


Laser molecular-beam epitaxy has been used to form Co40Fe40B20 layers on Bi2Te3 topological insulator substrates, and their growth conditions have been studied. The possibility of growing epitaxial ferromagnetic layers on the surface of a topological insulator is demonstrated for the first time. The CoFeB layers have a body-centered cubic crystal structure with the (111) crystal plane parallel to the (0001) plane of Bi2Te3. 3D mapping in the reciprocal space of high-energy electron-diffraction patterns made it possible to determine the epitaxial relationships between the film and the substrate.

Язык оригиналаанглийский
Страницы (с-по)184-186
Число страниц3
ЖурналTechnical Physics Letters
Номер выпуска3
СостояниеОпубликовано - 1 мар 2018


Подробные сведения о темах исследования «A Study of the Crystal Structure of Co<sub>40</sub>Fe<sub>40</sub>B<sub>20</sub> Epitaxial Films on a Bi<sub>2</sub>Te<sub>3</sub> Topological Insulator». Вместе они формируют уникальный семантический отпечаток (fingerprint).