The use of 2D diffractometry data for oriented samples in the choice of a unit cell

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Abstract

An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.

Original languageEnglish
Pages (from-to)953-963
Number of pages11
JournalJournal of Structural Chemistry
Volume58
Issue number5
DOIs
Publication statusPublished - 1 Sep 2017

Keywords

  • indexing
  • oriented samples
  • palladium phthalocyanines
  • thin films
  • X-ray diffractometry of polycrystals

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