The Nature of Defects Responsible for Transport in a Hafnia-Based Resistive Random Access Memory Element

D. R. Islamov, T. V. Perevalov, V. A. Gritsenko, V. Sh Aliev, A. A. Saraev, V. V. Kaichev, E. V. Ivanova, M. V. Zamoryanskaya, A. Chin

Research output: Chapter in Book/Report/Conference proceedingChapterResearchpeer-review

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