Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

N. N. Novikova; V. A. Yakovlev; S. A. Klimin; T. V. Malin; A. M. Gilinsky; K. S. Zhuravlev

doi:10.1134/S0030400X19070208

Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

N. N. Novikova, V. A. Yakovlev, S. A. Klimin, T. V. Malin, A. M. Gilinsky, K. S. Zhuravlev

Лаборатория полупроводниковых и диэлектрических материалов ФФ

Research output: Contribution to journal › Article › peer-review

Abstract

Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

Original language	English
Pages (from-to)	36-39
Number of pages	4
Journal	Optics and Spectroscopy
Volume	127
Issue number	1
DOIs	https://doi.org/10.1134/S0030400X19070208
Publication status	Published - 1 Jul 2019

Keywords

aluminum and gallium nitrides
reflection and ATR spectroscopy
surface polaritons
VIBRATIONS

Access to Document

10.1134/S0030400X19070208

Cite this

@article{32aec2e9139b4711ab93aae0ff0ce4eb,

title = "Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films",

abstract = "Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.",

keywords = "aluminum and gallium nitrides, reflection and ATR spectroscopy, surface polaritons, VIBRATIONS",

author = "Novikova, {N. N.} and Yakovlev, {V. A.} and Klimin, {S. A.} and Malin, {T. V.} and Gilinsky, {A. M.} and Zhuravlev, {K. S.}",

year = "2019",

month = jul,

day = "1",

doi = "10.1134/S0030400X19070208",

language = "English",

volume = "127",

pages = "36--39",

journal = "Optics and Spectroscopy (English translation of Optika i Spektroskopiya)",

issn = "0030-400X",

publisher = "Maik Nauka Publishing / Springer SBM",

number = "1",

}

TY - JOUR

T1 - Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

AU - Novikova, N. N.

AU - Yakovlev, V. A.

AU - Klimin, S. A.

AU - Malin, T. V.

AU - Gilinsky, A. M.

AU - Zhuravlev, K. S.

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

AB - Abstract: The reflection and attenuated total reflection spectra of aluminum and gallium nitride films doped with silicon on sapphire substrates with a buffer layer of aluminum nitride have been measured. In the spectra of attenuated total reflection, surface phonon and plasmon–phonon polaritons were observed. A high concentration of charge carriers in the gallium nitride film and their practical absence in the aluminum nitride film were experimentally observed.

KW - aluminum and gallium nitrides

KW - reflection and ATR spectroscopy

KW - surface polaritons

KW - VIBRATIONS

UR - http://www.scopus.com/inward/record.url?scp=85070857427&partnerID=8YFLogxK

U2 - 10.1134/S0030400X19070208

DO - 10.1134/S0030400X19070208

M3 - Article

AN - SCOPUS:85070857427

VL - 127

SP - 36

EP - 39

JO - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

JF - Optics and Spectroscopy (English translation of Optika i Spektroskopiya)

SN - 0030-400X

IS - 1

ER -

Surface Polaritons in Silicon-Doped Aluminum and Gallium Nitride Films

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this