Silicon diffractive optical element with piecewise continuous profile to focus high-power terahertz radiation into a square area

Maxim S. Komlenok, Taras V. Kononenko, Vitaly I. Konov, Yulia Yu Choporova, Natalya D. Osintseva, Boris A. Knyazev, Vladimir S. Pavelyev, Konstantin N. Tukmakov, Victor A. Soifer

Research output: Contribution to journalArticlepeer-review

Abstract

A technique of high-frequency laser ablation using a 2D beam scanner has been designed and applied to creation of a silicon diffractive optical element (DOE) with a continuous profile to focus a terahertz Gaussian beam into a square region. The microrelief of the resulting silicon DOE has been analyzed with a white-light interferometer and a scanning electron microscope. The distribution of radiation behind the DOE illuminated by a high-power beam of the Novosibirsk free-electron laser at a wavelength of 130 µm, recorded with a pyroelectric camera, has been demonstrated. The measured diffraction efficiency of the DOE is equal to 97 ± 2%.

Original languageEnglish
Pages (from-to)B9-B13
Number of pages5
JournalJournal of the Optical Society of America B: Optical Physics
Volume38
Issue number8
DOIs
Publication statusPublished - 2021

OECD FOS+WOS

  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

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