Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)

A. I. Chichinin, M. Poretskiy, C. Maul, K. H. Gericke

Research output: Contribution to journalArticlepeer-review

Abstract

A trap for positive ions (H+, Cl+, HCl+) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl, H) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.

Original languageEnglish
Pages (from-to)303-307
Number of pages5
JournalBulletin of the Lebedev Physics Institute
Volume45
Issue number10
DOIs
Publication statusPublished - 1 Oct 2018

Keywords

  • Cl
  • H
  • HCl
  • ion collisions with surface
  • resonance-enhanced multiphoton ionization
  • time-of-flight mass-spectrometry

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