Reentrant resistive behavior and dimensional crossover in disordered superconducting TiN films

Svetlana V. Postolova, Alexey Yu Mironov, Mikhail R. Baklanov, Valerii M. Vinokur, Tatyana I. Baturina

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

A reentrant temperature dependence of the normal state resistance often referred to as the N-shaped temperature dependence, is omnipresent in disordered superconductors - ranging from high-temperature cuprates to ultrathin superconducting films - that experience superconductor-to-insulator transition. Yet, despite the ubiquity of this phenomenon its origin still remains a subject of debate. Here we investigate strongly disordered superconducting TiN films and demonstrate universality of the reentrant behavior. We offer a quantitative description of the N-shaped resistance curve. We show that upon cooling down the resistance first decreases linearly with temperature and then passes through the minimum that marks the 3D-2D crossover in the system. In the 2D temperature range the resistance first grows with decreasing temperature due to quantum contributions and eventually drops to zero as the system falls into a superconducting state. Our findings demonstrate the prime importance of disorder in dimensional crossover effects.

Original languageEnglish
Article number1718
Pages (from-to)1718
Number of pages7
JournalScientific Reports
Volume7
Issue number1
DOIs
Publication statusPublished - 11 May 2017

Keywords

  • CRITICAL-FIELD
  • DEPENDENCE
  • INSULATOR-TRANSITION
  • NORMAL-STATE
  • PSEUDOGAP
  • SURFACE
  • TEMPERATURE
  • THIN-FILMS
  • TRANSPORT-PROPERTIES

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