Radiation stability and hyperfine mode structure of the terahertz NovoFEL

V. V. Kubarev, Ya V. Getmanov, O. A. Shevchenko

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

1 Citation (Scopus)

Abstract

The hyperfine spectral structure of radiation − laser modes of the Novosibirsk terahertz free electron laser (NovoFEL) has been measured in two its main operating regimes: resonance unstable regime with maximum output power and stabilized regime with maximum spectral power. The monochromaticity of the mode structure is shown to be practically independent of the laser operating regime and reaches a value of 2·10-8. The mode composition weakly depends on the operating regime for a well aligned electron beam and consists of many longitudinal TEMq00 modes (supermode). In the case of a poorly aligned electron beam, transverse modes of the optical cavity are also excited; its intensities strongly increase in the resonance regime.

Original languageEnglish
Title of host publicationSynchrotron and Free Electron Laser Radiation
Subtitle of host publicationGeneration and Application, SFR 2020
EditorsBoris Knyazev, Nikolay Vinokurov
PublisherAmerican Institute of Physics Inc.
ISBN (Electronic)9780735440333
DOIs
Publication statusPublished - 17 Nov 2020
Event2020 Internetional Conference on Synchrotron and Free Electron Laser Radiation: Generation and Application, SFR 2020 - Novosibirsk, Russian Federation
Duration: 13 Jul 202016 Jul 2020

Publication series

NameAIP Conference Proceedings
Volume2299
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference2020 Internetional Conference on Synchrotron and Free Electron Laser Radiation: Generation and Application, SFR 2020
CountryRussian Federation
CityNovosibirsk
Period13.07.202016.07.2020

OECD FOS+WOS

  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

Fingerprint

Dive into the research topics of 'Radiation stability and hyperfine mode structure of the terahertz NovoFEL'. Together they form a unique fingerprint.

Cite this