The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.
|Journal||Journal of Physics: Conference Series|
|Publication status||Published - 9 Oct 2020|
|Event||22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 - Moscow, Russian Federation|
Duration: 3 Mar 2020 → 5 Mar 2020