Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

A. K. Nikitin; O. V. Khitrov; V. V. Gerasimov

doi:10.1088/1742-6596/1636/1/012037

Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

A. K. Nikitin, O. V. Khitrov, V. V. Gerasimov

Applied Electrodynamics Laboratory

Research output: Contribution to journal › Conference article › peer-review

Abstract

The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

Original language	English
Article number	012037
Journal	Journal of Physics: Conference Series
Volume	1636
Issue number	1
DOIs	https://doi.org/10.1088/1742-6596/1636/1/012037
Publication status	Published - 9 Oct 2020
Event	22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 - Moscow, Russian Federation Duration: 3 Mar 2020 → 5 Mar 2020

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10.1088/1742-6596/1636/1/012037

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@article{b51f9c6f61e64b6382e2ea4f24d41361,

title = "Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range",

abstract = "The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.",

author = "Nikitin, {A. K.} and Khitrov, {O. V.} and Gerasimov, {V. V.}",

year = "2020",

month = oct,

day = "9",

doi = "10.1088/1742-6596/1636/1/012037",

language = "English",

volume = "1636",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020 ; Conference date: 03-03-2020 Through 05-03-2020",

}

TY - JOUR

T1 - Quality control of solid surfaces by the method of surface plasmon interferometry in the terahertz range

AU - Nikitin, A. K.

AU - Khitrov, O. V.

AU - Gerasimov, V. V.

PY - 2020/10/9

Y1 - 2020/10/9

N2 - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

AB - The article considers the possibility of controlling the quality of a conducting surface using a Michelson interferometer, in which the information carrier is surface plasmon-polaritons (a type of surface electromagnetic waves) of the terahertz range. It is shown that using such an interferometer, it is possible both to control the uniformity of the dielectric coating on the surface of a metal product, and to detect inhomogeneities on the controlled surface, as well as to evaluate their geometric and optical characteristics.

UR - http://www.scopus.com/inward/record.url?scp=85092616908&partnerID=8YFLogxK

U2 - 10.1088/1742-6596/1636/1/012037

DO - 10.1088/1742-6596/1636/1/012037

M3 - Conference article

AN - SCOPUS:85092616908

VL - 1636

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

SN - 1742-6588

IS - 1

M1 - 012037

T2 - 22nd Russian National Conference on Non-Destructive Testing and Technical Diagnostics: Transformation of Non-Destructive Testing and Technical Diagnostics in the Era of Digitalization. Society Security in a Changing World, RNCNDTTD 2020

Y2 - 3 March 2020 through 5 March 2020

ER -