Plasmon-Enhanced Near-Field Optical Spectroscopy of Multicomponent Semiconductor Nanostructures

K. V. Anikin, A. G. Milekhin, M. Rahaman, T. A. Duda, I. A. Milekhin, E. E. Rodyakina, R. B. Vasiliev, V. M. Dzhagan, D. R.T. Zahn, A. V. Latyshev

Research output: Contribution to journalArticlepeer-review

Abstract

Multicomponent semiconductor nanostructures were studied by local spectral analysis based on surface-enhanced Raman scattering by semiconductor nanostructures located on the surface of an array of Au nanoclusters near the metallized tip of an atomic force microscope. In the gap between the metal nanoclusters and the tip, where a semiconductor nanostructure is located, there is a strong increase in the local electric field (hot spot), resulting in a dramatic enhancement of the Raman scattering signal. An unprecedented enhancement of the Raman scattering signal by two-dimensional (over 108 for MoS2) and zero-dimensional (106 for CdSe nanocrystals) semiconductor nanostructures was achieved. The use of the method for mapping the Raman scattering response of a multicomponent system of MoS2 and CdSe made it possible to identify components with a spatial resolution far exceeding the diffraction limit.

Original languageEnglish
Pages (from-to)488-494
Number of pages7
JournalOptoelectronics, Instrumentation and Data Processing
Volume55
Issue number5
DOIs
Publication statusPublished - 1 Sep 2019

Keywords

  • nanostructures
  • phonons
  • plasmons
  • quantum dots
  • surface-enhanced Raman scattering of light
  • two-dimensional structures

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