Light Emission by Monolayers of Molybdenum Disulfide

A. V. Marchenko, N. N. Kurus, A. A. Kolosvetov, A. G. Milekhin

Research output: Contribution to journalArticlepeer-review

Abstract

A comprehensive study of molybdenum disulfide monolayers formed on a silicon substrate is carried out using Raman scattering (RS), photoluminescence (PL), and by comparison with the data of atomic force microscopy (AFM). Maps of the intensity distribution of exciton PL and Raman scattering by optical phonons from monolayer MoS2 films are obtained. The dependences of the frequencies of the fundamental vibrational modes of MoS2 (A1g and E2g) on the thickness of monolayer coatings are obtained. An enhancement of the Raman mode of the optical phonon of silicon by a bilayer of molybdenum disulfide is found. A hypothesis on the interference enhancement of Raman scattering of light by phonon modes of silicon is proposed.

Translated title of the contributionЭмиссия света монослоями дисульфида молибдена
Original languageEnglish
Article number12
Pages (from-to)532-538
Number of pages7
JournalOptoelectronics, Instrumentation and Data Processing
Volume57
Issue number5
DOIs
Publication statusPublished - Sep 2021

Keywords

  • atomic force microscopy (AFM)
  • enhancement of the Raman scattering on the optical phonon modes of silicon
  • molybdenum disulfide MoS${}_{2}$
  • photoluminescence (PL)
  • Raman scattering (RS)

OECD FOS+WOS

  • 2.02 ELECTRICAL ENG, ELECTRONIC ENG
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

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