Laser-Induced Damage Threshold of Barium Chalcogenides Crystals at 2091 nm

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Abstract

This paper is devoted to a determination of the 0% probability laser-induced damage threshold of the BaGa4Se7 and BaGa2GeSe6 nonlinear elements by the R-on-1 procedure. A Ho:YAG laser radiation at 2091 nm with pulse duration 13-17 ns and varied pulse repetition rate, 2 kHz, 5 kHz and 10 kHz, was used for testing.

Original languageEnglish
Title of host publicationProceedings - International Conference Laser Optics 2020, ICLO 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728152332
DOIs
Publication statusPublished - 2 Nov 2020
Event2020 International Conference Laser Optics, ICLO 2020 - St. Petersburg, Russian Federation
Duration: 2 Nov 20206 Nov 2020

Publication series

NameProceedings - International Conference Laser Optics 2020, ICLO 2020

Conference

Conference2020 International Conference Laser Optics, ICLO 2020
CountryRussian Federation
CitySt. Petersburg
Period02.11.202006.11.2020

Keywords

  • barium chalcogenides
  • laser-induced damage threshold (LIDT)

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