Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg1 –xCdхTe Films Grown Using Molecular Beam Epitaxy

V. A. Shvets, D. V. Marin, M. V. Yakushev, S. V. Rykhlitskii

Research output: Contribution to journalArticlepeer-review

Abstract

Based on in situ and ex situ ellipsometric measurements, the spectral dependences of the temperature sensitivity of the optical constants Hg1 – xCdхTe—dn(λ) and dk(λ) have been found for a series of samples of different compositions in the range from 0.160 to 0.327. The experiments were performed during cooling of the grown samples in a vacuum chamber. It has been found that the obtained dn and dk dependences can be well approximated by the sum of three Lorentz oscillators with the addition of the dispersion terms of the Cauchy formula. A parametric model that describes the sensitivities dn(λ) and dk(λ) for an arbitrary composition x in the specified range near the growth temperature has been proposed. Ex situ temperature measurements performed near room temperature correlate with the data of the high-temperature measurements. The results obtained are relevant for the development of ellipsometric control methods in situ of Hg1 – xCdхTe layer growth processes.

Original languageEnglish
Pages (from-to)29-36
Number of pages8
JournalOptics and Spectroscopy
Volume129
Issue number1
DOIs
Publication statusPublished - Jan 2021

Keywords

  • cadmium–mercury telluride
  • ellipsometry
  • molecular beam epitaxy
  • spectra of optical constants
  • temperature sensitivity

OECD FOS+WOS

  • 2.05 MATERIALS ENGINEERING
  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY
  • 1.03.UH PHYSICS, ATOMIC, MOLECULAR & CHEMICAL
  • 1.03.SY OPTICS
  • 2.11.XQ SPECTROSCOPY

Fingerprint

Dive into the research topics of 'Investigation of the Temperature Dependence of the Spectra of Optical Constants of Hg<sub>1 –</sub><sub>x</sub>Cd<sub>х</sub>Te Films Grown Using Molecular Beam Epitaxy'. Together they form a unique fingerprint.

Cite this