Evolution of the transverse and longitudinal energy distributions of electrons emitted from a GaAsP photocathode as a function of its degradation state

L. B. Jones, H. E. Scheibler, D. V. Gorshkov, A. S. Terekhov, B. L. Militsyn, T. C.Q. Noakes

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6 Citations (Scopus)

Abstract

We present measurements of the transverse and longitudinal energy spread of photoelectrons emitted from a GaAsP photocathode as a function of its degradation state. The cathode was initially activated to a state of negative electron affinity in our photocathode preparation facility, achieving a quantum efficiency of 3% at a wavelength of 532 nm. It was then transferred under XHV conditions to our transverse energy spread spectrometer, where energy spread measurements were made while the photocathode was progressively degraded through a controlled exposure to oxygen. Data have been collected under photocathode illumination at 532 nm, and the changing photoelectron energy distribution associated with the changes in the level of electron affinity due to quantum efficiency degradation through an exposure to 0.25 L of oxygen has been demonstrated. Our experiments have shown that GaAsP boasts a significantly higher resilience to degradation under exposure to oxygen than a GaAs photocathode, though it does exhibit a higher level of mean transverse energy. Coupled with the favourable published data on GaAsP photoemission response times, we conclude that GaAsP is a viable candidate material as a particle accelerator electron source.

Original languageEnglish
Article number225703
Number of pages9
JournalJournal of Applied Physics
Volume121
Issue number22
DOIs
Publication statusPublished - 14 Jun 2017

Keywords

  • GAAS1-XPX ALLOYS
  • AFFINITY

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