Abstract
Scanning devices based on multirow focal plane arrays providing increased resolution impose much more stringent requirements on alignment than single-row arrays. This paper presents a new method for measuring and estimating the scanning speed and the angle of orientation of a multirow focal plane array relative to the scanning direction — the parameters that determine the quality of the discrete image formed. The method is based on an analysis of the image of a simple test object — an optical slit. An algorithm for estimating these parameters is proposed which provides high-accuracy estimates under fairly weak requirements for the image quality of the test object. The estimation accuracy was calculated analytically and confirmed by simulation modeling.
Original language | English |
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Pages (from-to) | 570-575 |
Number of pages | 6 |
Journal | Optoelectronics, Instrumentation and Data Processing |
Volume | 53 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1 Nov 2017 |
Keywords
- focal plane array
- orientation of focal plane array
- scanning device
- scanning speed
- time delay integration