Dynamics of Growth of the Native Oxide of Cd xHg1−xTe

G. Yu Sidorov, V. A. Shvets, Yu G. Sidorov, V. S. Varavin

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)

Abstract

The growth of the native oxide of the CdxHg1−xTe (MCT) compound is studied by methods of laser and spectral ellipsometry. It is found that a non-absorbing oxide film is formed from the very beginning in the case of MCT oxidation with hydrogen peroxide vapors, whereas oxidation with atmospheric oxygen leads to the formation of absorbing layers on the surface at the first stages of the process. When the oxide film thickness reaches 1–2 nm, the oxidation rate drastically decreases. If MCT samples that were stored for a long time (for years) in air at room temperature are heated at T = 200 °C, the optical thickness of the oxide film decreases.

Original languageEnglish
Pages (from-to)617-624
Number of pages8
JournalOptoelectronics, Instrumentation and Data Processing
Volume53
Issue number6
DOIs
Publication statusPublished - 1 Nov 2017

Keywords

  • ellipsometry
  • MCT
  • native oxide
  • SEMICONDUCTOR

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