Development of an Application Specific Integrated Circuit for Signal Detection in Experimental Studies of Fast Processes

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents a new integrated circuit designed for signal readout in a silicon microstrip detector in experimental observations of fast processes at a synchrotron radiation beam. The first variants of this circuit were used in a prototype detector based on a microstrip silicon sensor and were tested at an intense synchrotron radiation beam at the VEPP-4M storage ring in the Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences. The results of the first measurements showed that the main objectives of this development were achieved: the time resolution and frame rate satisfy the initial specifications and the maximum detected signal in a linear mode of operation provides a significant increase in the detected photon flux compared to the previous version of the detector based on gas technology. The main problem detected during testing of the prototype is the relatively high noise level, which will be reduced in the next version of the integrated circuit by optimizing some circuit solutions.

Original languageEnglish
Pages (from-to)81-88
Number of pages8
JournalOptoelectronics, Instrumentation and Data Processing
Volume56
Issue number1
DOIs
Publication statusPublished - 1 Jan 2020

Keywords

  • application specific integrated circuit
  • fast processes
  • microstrip silicon detector
  • synchrotron radiation

Fingerprint Dive into the research topics of 'Development of an Application Specific Integrated Circuit for Signal Detection in Experimental Studies of Fast Processes'. Together they form a unique fingerprint.

Cite this