Control of the conducting surface by terahertz surface electromagnetic waves

A. K. Nikitin, V. V. Gerasimov, B. A. Knyazev, N. T.H. Lien, T. T. Trang

Research output: Contribution to journalConference articlepeer-review

Abstract

The paper considers the possibilities of quality control of the conductive surface and detection of objects on it beyond the horizon, as well as microscopy of flat faces of semiconductor products using surface electromagnetic waves (SEWs) of the terahertz (THz) range. The conditions under which such methods of control can be implemented are determined; schemes of devices that implement such measurements are elaborated; estimates of the possibilities of the developed methods for monitoring metal and semiconductor products probed by monochromatic THz radiation in the form of SEWs are given.

Fingerprint

Dive into the research topics of 'Control of the conducting surface by terahertz surface electromagnetic waves'. Together they form a unique fingerprint.

Cite this