Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov; G. V. Kuptsov; A. I. Nozdrina; V. A. Petrov; A. V. Laptev; A. V. Kirpichnikov; E. V. Pestryakov

doi:10.1070/QEL16972

Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov, G. V. Kuptsov, A. I. Nozdrina, V. A. Petrov, A. V. Laptev, A. V. Kirpichnikov, E. V. Pestryakov

Research output: Contribution to journal › Article › peer-review

9 Citations (Scopus)

Abstract

A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm^-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

Original language	English
Pages (from-to)	358-361
Number of pages	4
Journal	Quantum Electronics
Volume	49
Issue number	4
DOIs	https://doi.org/10.1070/QEL16972
Publication status	Published - 1 Jan 2019

Keywords

cryogenic temperatures
diode pumping
high pulse repetition rate
laser amplifier
laser thermometry
AVERAGE-POWER
LASER CRYSTALS

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10.1070/QEL16972

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abstract = "A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.",

keywords = "cryogenic temperatures, diode pumping, high pulse repetition rate, laser amplifier, laser thermometry, AVERAGE-POWER, LASER CRYSTALS",

author = "Petrov, {V. V.} and Kuptsov, {G. V.} and Nozdrina, {A. I.} and Petrov, {V. A.} and Laptev, {A. V.} and Kirpichnikov, {A. V.} and Pestryakov, {E. V.}",

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doi = "10.1070/QEL16972",

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AU - Petrov, V. V.

AU - Kuptsov, G. V.

AU - Nozdrina, A. I.

AU - Petrov, V. A.

AU - Laptev, A. V.

AU - Kirpichnikov, A. V.

AU - Pestryakov, E. V.

PY - 2019/1/1

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N2 - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

AB - A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

KW - cryogenic temperatures

KW - diode pumping

KW - high pulse repetition rate

KW - laser amplifier

KW - laser thermometry

KW - AVERAGE-POWER

KW - LASER CRYSTALS

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JO - Quantum Electronics

JF - Quantum Electronics

SN - 1063-7818

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ER -

Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

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Keywords

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