Contactless method for studying temperature within the active element of a multidisk cryogenic amplifier

V. V. Petrov, G. V. Kuptsov, A. I. Nozdrina, V. A. Petrov, A. V. Laptev, A. V. Kirpichnikov, E. V. Pestryakov

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.

Original languageEnglish
Pages (from-to)358-361
Number of pages4
JournalQuantum Electronics
Volume49
Issue number4
DOIs
Publication statusPublished - 1 Jan 2019

Keywords

  • cryogenic temperatures
  • diode pumping
  • high pulse repetition rate
  • laser amplifier
  • laser thermometry
  • AVERAGE-POWER
  • LASER CRYSTALS

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