Abstract
A new original method has been developed and experimentally implemented, allowing temperature fields to be contactlessly measured in the pump region of active elements in high-power-diode-pumped laser amplifiers, including those operating at cryogenic temperatures. The presence of a temperature gradient of ∼57 K mm-1 along the pump beam axis at the centre of the active element of the laser amplification unit operating at cryogenic temperatures with a pulse repetition rate up to 1 kHz is simulated and experimentally confirmed.
Original language | English |
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Pages (from-to) | 358-361 |
Number of pages | 4 |
Journal | Quantum Electronics |
Volume | 49 |
Issue number | 4 |
DOIs | |
Publication status | Published - 1 Jan 2019 |
Keywords
- cryogenic temperatures
- diode pumping
- high pulse repetition rate
- laser amplifier
- laser thermometry
- AVERAGE-POWER
- LASER CRYSTALS