Прецизионное измерение оптических характеристик приповерхностного слоя твердых тел

Translated title of the contribution: Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids

Research output: Contribution to journalArticlepeer-review

Abstract

A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been experimentally tested with refractive index standards. The uniqueness of the reconstruction of the refractive indices of the substrate and subsurface layer, as well as the thickness of the layer, from the measured reflection coefficient of probe radiation near the Brewster angle and the angle of normal incidence has been demonstrated numerically. The measurements of the refractive index of the subsurface layer with an absolute error of 10–4 and the thickness of the subsurface layer with a confidence error of 1 nm have been performed for the first time.
Translated title of the contributionPrecise Measurement of the Optical Characteristics of the Subsurface Layer of Solids
Original languageRussian
Article number3
Pages (from-to)304-310
Number of pages7
JournalПисьма в Журнал экспериментальной и теоретической физики
Volume114
Issue number5
DOIs
Publication statusPublished - Sep 2021

OECD FOS+WOS

  • 1.03 PHYSICAL SCIENCES AND ASTRONOMY

State classification of scientific and technological information

  • 29 PHYSICS

Fingerprint

Dive into the research topics of 'Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids'. Together they form a unique fingerprint.

Cite this