We propose a technique for the refinement of unit cell parameters (UCPs) using a single crystal diffractometer equipped with a flat-panel area detector. The technique is based on choosing Kα1 components of X-ray radiation when processing diffraction reflections. The capabilities of the technique are demonstrated on [NiEn3]MoO4 single crystals. In two independent experiments, the difference between 2θexp and 2θcalc did not exceed 0.02° while the reproducibility of unit cell parameters was at least 0.008 Å.
|Translated title of the contribution||On the accuracy of determining unit cell parameters of single crystals on modern laboratory diffractometers|
|Number of pages||11|
|Journal||Журнал структурной химии|
|Publication status||Published - May 2021|
- 1.04 CHEMICAL SCIENCES
State classification of scientific and technological information
- 31 CHEMISTRY